The University of Hartford will be hosting a Special Training Forum in Practical Aspects of Scanning Electron Microscopy for Advanced Manufacturing in the United States which will run from April 9-13, 2018. The course, presented by Michael T. Postek, András E. Vládar, Dianne L. Poster, Suhash Ghosh, and Chittaranj Sahay features a…
The University of Hartford College of Engineering, Technology, and Architecture, Center for Manufacturing and Metrology
Special Training Forum: Practical Aspects of Scanning Electron Microscopy for Advanced Manufacturing in the United States
Presented by Michael T. Postek, András E. Vládar, Dianne L. Poster, Suhash Ghosh, and Chittaranj Sahay
- Full Hands-On Laboratories, Skills Building, & Training
- Explore the Role & Use of Microscopes and Accessory Equipment in Manufacturing & Metrology for Industry, Academia and Government R&D
- Discover Basic Theoretical and Practical Aspects of Microscopy for Fostering Better Manufacturing Innovation & Accelerating Product Development
The scanning electron microscope has become an indispensable tool in recent years by industrial, government and academic scientists in numerous research, production and Advanced Manufacturing applications. Manufacturers of microscopes and accessory equipment have responded to this increased demand with advanced instruments equipped with a wide range of innovative features. To obtain maximum performance from these state-of-the-art instruments, a basic theoretical and practical knowledge of SEM and associated techniques is essential. This course is designed to provide SEM operators with this basic theoretical and practical training by using integrated lectures and hands-on laboratory exercises.
Practical Aspects of Scanning Electron Microscopy is an intensive five-day short course, providing a thorough coverage of the basic theory and practice of SEM. Lectures coordinated with supervised laboratory exercises provide students with an informed hands-on experience on contemporary SEMs equipped with modern accessories.
Dr. Michael T. Postek (retired), Course Coordinator, was the Senior Scientist in the Engineering Physics Division of the National Institute of Standards and Technology, Gaithersburg, MD and has over 40 years of experience in SEM.
Dr. Andras E. Vladar is the SEM Metrology project leader of the Nanoscale Metrology Group at the National Institute of Standards and Technology, Gaithersburg, MD.
Dr. Dianne L. Poster is the Special Assistant for Innovation and Industry Services at the National Institute of Standards and Technology.
Dr . Chittaranj Sahay is the Director, Center for Manufacturing and Metrology and member of the Connecticut Academy of Science and Engineering, University of Hartford
Dr. Suhash Ghosh professor, Center for Manufacturing and Metrology, University of Hartford