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University of Hartford Center for Manufacturing and Metrology: Practical Aspects of Scanning Electron Microscopy
June 26, 2017 @ 1:00 pm - June 30, 2017 @ 1:00 pm
The scanning electron microscope has become an indispensable tool in recent years by industrial, government and academic scientists in numerous research, production and quality control applications. Manufacturers of microscopes and accessory equipment have responded to this increased demand with advanced instruments equipped with a wide range of innovative features. To obtain maximum performance from these state-of- the-art instruments, a basic theoretical and practical knowledge of SEM and associated techniques is essential. This course is designed to provide SEM operators with this basic theoretical and practical training by using integrated lectures and hands-on laboratory exercises.
Practical Aspects of Scanning Electron Microscopy: Reboot is an intensive four-day short course, providing a thorough coverage of the basic theory and practice of SEM. Lectures coordinated with supervised laboratory exercises provide students with an informed hands-on experience on contemporary SEMs equipped with modern accessories.
WHO SHOULD ATTEND
Practical Aspects of Scanning Electron Microscopy: Reboot is directed toward government, academic and industrial users of the SEM who are interested in learning current practical methodology in the operation of the SEM and accessory equipment. The lectures and laboratory exercises are basic and beneficial to microscopists at all levels from novice through advanced user. Due to the limited class size, participants are provided with the opportunity to acquire extensive hands-on experience with modern SEM instrumentation. A total of 15 hours of lecture and 13 hours of hands-on laboratory sessions are scheduled into the four-day course. Extensive discussion time with the experts is also available.
The course fee including cost of course materials is $2,495.